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Volumn 41, Issue 11, 2002, Pages 6493-6497
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Growth and characterization of diamond films on SiO2/Si substrates
a a a,b a a a,c |
Author keywords
Cracks; Diamond films; MPECVD; Shrinkage; SiO2 Si substrates
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Indexed keywords
CHARACTERIZATION;
CRACK INITIATION;
FILM GROWTH;
INSULATING MATERIALS;
MICROWAVES;
PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;
SAPPHIRE;
SCANNING ELECTRON MICROSCOPY;
SHRINKAGE;
SILICA;
SUBSTRATES;
TRANSMISSION ELECTRON MICROSCOPY;
INSULATING WAFERS;
DIAMOND FILMS;
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EID: 0036872483
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/jjap.41.6493 Document Type: Article |
Times cited : (1)
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References (13)
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