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Volumn 15, Issue 4, 2002, Pages 420-426

Knowledge transfer and the limits to profitability: An empirical study of problem-solving practices semiconductor manufacturing and process development

Author keywords

Development; Knowledge; Limits; Manufacturing; Problem; Process; Profitability; Se miconductor; Solving; Transfer

Indexed keywords

DEFECTS; INTERNET; OPTIMIZATION; PROBLEM SOLVING; PRODUCTIVITY;

EID: 0036869944     PISSN: 08946507     EISSN: None     Source Type: Journal    
DOI: 10.1109/TSM.2002.804877     Document Type: Conference Paper
Times cited : (21)

References (16)
  • 2
    • 0001993639 scopus 로고    scopus 로고
    • New industry document explores defect reduction technology challenges
    • Jan.
    • D. Jensen, C. Gross, and D. Mehta, "New industry document explores defect reduction technology challenges," Micro, pp. 35-44, Jan. 1998.
    • (1998) Micro , pp. 35-44
    • Jensen, D.1    Gross, C.2    Mehta, D.3
  • 3
    • 0000273410 scopus 로고
    • Capital productivity: Major challenge for the semiconductor industry
    • March
    • P. Silverman, "Capital productivity: Major challenge for the semiconductor industry," Solid State Technol., vol. 37, no. 3, p. 104, March 1994.
    • (1994) Solid State Technol. , vol.37 , Issue.3 , pp. 104
    • Silverman, P.1
  • 4
    • 0032095928 scopus 로고    scopus 로고
    • What drives defect detection technology?
    • June
    • C. Weber, D. Jensen, and E.D. Hirleman, "What drives defect detection technology?," Micro, pp. 51-72, June 1998.
    • (1998) Micro , pp. 51-72
    • Weber, C.1    Jensen, D.2    Hirleman, E.D.3
  • 5
    • 85015113811 scopus 로고    scopus 로고
    • Quantifying the value of ownership of yield analysis technologies
    • Boston, MA, Sept. 8
    • C. Weber, V. Sankaran, G. Scher, and K. Tobin, "Quantifying the value of ownership of yield analysis technologies," in Proc. IEEE/SEMI/ASMC, Boston, MA, Sept. 8, 1999, pp. 64-70.
    • (1999) Proc. IEEE/SEMI/ASMC , pp. 64-70
    • Weber, C.1    Sankaran, V.2    Scher, G.3    Tobin, K.4
  • 6
    • 0004201621 scopus 로고
    • New York: Cambridge Univ. Press
    • J. Baron, Thinking and Deciding. New York: Cambridge Univ. Press, 1988, pp. 43-47.
    • (1988) Thinking and Deciding , pp. 43-47
    • Baron, J.1
  • 7
    • 0343170815 scopus 로고
    • Expert and novice performance in solving physics problems
    • J. Larkin, J. McDermott, D.P. Simon, and H.A. Simon, "Expert and novice performance in solving physics problems," Sci., vol. 208, pp. 1335-1342, 1980.
    • (1980) Sci. , vol.208 , pp. 1335-1342
    • Larkin, J.1    McDermott, J.2    Simon, D.P.3    Simon, H.A.4
  • 8
    • 0000097622 scopus 로고
    • Sticky information and the locus of problem solving: Implications for innovation
    • Apr.
    • E. von Hippel, "Sticky information and the locus of problem solving: Implications for innovation," Manage. Sci., vol. 40, no. 4, pp. 429-439, Apr. 1994.
    • (1994) Manage. Sci. , vol.40 , Issue.4 , pp. 429-439
    • Von Hippel, E.1
  • 10
    • 0002966481 scopus 로고    scopus 로고
    • Step fighting fires
    • R. Bohn, "Step fighting fires," Harvard Bus. Rev., vol. 78, no. 4, pp. 82-91, 2000.
    • (2000) Harvard Bus. Rev. , vol.78 , Issue.4 , pp. 82-91
    • Bohn, R.1
  • 11
    • 0009993525 scopus 로고
    • A dynamic theory of organizational knowledge creation
    • I. Nonaka, "A dynamic theory of organizational knowledge creation," Org. Sci., vol. 5, no. 1, pp. 14-37, 1994.
    • (1994) Org. Sci. , vol.5 , Issue.1 , pp. 14-37
    • Nonaka, I.1
  • 13
    • 0032071638 scopus 로고    scopus 로고
    • Economics of product development by users: The impact of sticky local information
    • May
    • _, "Economics of product development by users: The impact of sticky local information," Manage. Sci., vol. 44, no. 5, pp. 629-643, May 1998.
    • (1998) Manage. Sci. , vol.44 , Issue.5 , pp. 629-643
  • 16
    • 0002436283 scopus 로고    scopus 로고
    • Technology integration
    • May-June
    • M. Iansiti and J. West, "Technology integration," Harvard Bus. Rev., pp. 69-79, May-June 1997.
    • (1997) Harvard Bus. Rev. , pp. 69-79
    • Iansiti, M.1    West, J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.