Growth and characterization of ZnCdTe-ZnTe quantum wells on ZnO coated Si substrate by metalorganic chemical vapor deposition

Journal of Crystal Growth

Volumn 233, Issue 4, 2001, Pages 795-798

  Shan, C X ^a   Fan, X W ^a   Zhang, J Y ^a   Zhang, Z Z ^a   Ma, J G ^a   Lu, Y M ^a   Liu, Y C ^a   Shen, D Z ^a  

^a CHANGCHUN INSTITUTE OF OPTICS   (China)

Author keywords

A1. atomic force microscopy; A1. low dimensional structures; A3. metalorganic chemical vapor deposition; A3. quantum wells; B2. semiconducting II VI materials; B2. semiconducting silicon

Indexed keywords

ATOMIC FORCE MICROSCOPY; METALLORGANIC CHEMICAL VAPOR DEPOSITION; MOLECULAR BEAM EPITAXY; PHOTOLUMINESCENCE; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING SILICON; SEMICONDUCTING ZINC COMPOUNDS; SUBSTRATES; SURFACE STRUCTURE; THIN FILMS; ZINC OXIDE;

BUFFER LAYERS; LOW DIMENSIONAL STRUCTURES;

SEMICONDUCTOR QUANTUM WELLS;

EID: 0035546491     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(01)01646-3     Document Type: Article

References (8)