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Volumn 60, Issue 3, 2002, Pages 467-473
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Multiscale modeling of anisotropic wet chemical etching of crystalline silicon
a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0036850050
PISSN: 02955075
EISSN: None
Source Type: Journal
DOI: 10.1209/epl/i2002-00287-1 Document Type: Article |
Times cited : (24)
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References (14)
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