The separation of surface and bulk contributions in ELNES spectra

Ultramicroscopy

Volumn 93, Issue 2, 2002, Pages 91-97

  Schattschneider, P ^a   Stoger M ^a   Hebert C ^a   Jouffrey, B ^b  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^b Grande Voie des Vignes   (France)

Author keywords

Electron energy loss spectrometry; Inelastic scattering; Surfaces and interfaces; Transmission electron microscopy

Indexed keywords

ELECTRONS; ERRORS; IONIZATION; SEPARATION; SPATIAL VARIABLES MEASUREMENT;

SCALING FACTORS;

MICROSCOPIC EXAMINATION;

ANALYTIC METHOD; ANALYTICAL ERROR; ARTICLE; ELECTRON ENERGY LOSS SPECTROSCOPY; IONIZATION; SEPARATION TECHNIQUE; SPECTRUM; SURFACE PROPERTY; VOLUMETRY;

EID: 0036837315     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(02)00144-4     Document Type: Article

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