Study on ferroelectric and dielectric properties of niobium doped Bi4Ti3O12 ceramics and thin films prepared by PLD method

Materials Letters

Volumn 56, Issue 5, 2002, Pages 861-866

  Bao, Z H ^a   Yao, Y Y ^a   Zhu, J S ^a   Wang, Y N ^a  

^a NANJING UNIVERSITY   (China)

Author keywords

Ceramics; Dielectric; Doping; Fatigue; Ferroelectric; PLD; Thin films

Indexed keywords

BISMUTH COMPOUNDS; DOPING (ADDITIVES); FATIGUE OF MATERIALS; FERROELECTRICITY; NIOBIUM; PERMITTIVITY; PULSED LASER DEPOSITION; THIN FILMS;

LOSS FACTOR;

CERAMIC MATERIALS;

EID: 0036828989     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-577X(02)00628-6     Document Type: Article

References (10)

1. Auciello O., Ramesh R. Laser-ablation deposition and characterization of ferroelectric capacitors for nonvolatile memories. MRS Bull. 21:1996;31-36.
2. 12 thin films. Appl. Phys. Lett. 62(16):1993;1928-1930.
3. Park B.H., Kang B.S., Bu S.D., Noh T.W., Lee J., Jo W. Lanthanum-substituted bismuth titanate for use in non-volatile memories. Nature. 401:1999;682-684.
4. 12) film capacitors having large spontaneous polarizations. Appl. Phys. Lett. 79(19):2001;3137-3139.
5. 12. Appl. Phys. Lett. 78(13):2001;1903-1905.
6. 12 thin films on the low-temperature deposition. Appl. Phys. Lett. 80(1):2002;100-102.
7. Haccart T., Cattan E., Remiens D., Hiboux S., Mukalt P. Ferroelectric and piezoelectric properties of Nb doped PZT films. Integr. Ferroelectr. 35(1-4):2001;239-248.
8. Gopalan S., Wong C.H., Balu V., Lee J.H., Han J.H., Mohammedali R., Lee J.C. Effect of niobium doping on the microstructure and electrical properties of strontium titanate thin films for semiconductor memory. Appl. Phys. Lett. 75(14):1999;2123-2125.
9. Wu W., Fumoto K., Oishi Y., Okuyama M., Hamakawa Y. Preparation of bismuth titanate thin films by laser ablation. Jpn. J. Appl. Phys. 34(Part 1, No. 9B):1995;5141-5145.
10. Damjanovic D. Ferroelectric, dielectric and piezoelectric properties of ferroelectric thin films and ceramics. Rep. Prog. Phys. 61:1998;1267-1324.