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Volumn 49 II, Issue 5, 2002, Pages 2415-2419

High-speed x-ray imaging camera for time-resolved diffraction studies

Author keywords

High speed X ray imaging; Image sensors; Structured CsI; X ray diffraction

Indexed keywords

CHARGE COUPLED DEVICES; HIGH SPEED CAMERAS; IMAGE INTENSIFIERS (ELECTRON TUBE); IMAGE SENSORS; IMAGING SYSTEMS; MICROSTRUCTURE; OPTICAL FIBER COUPLING; OPTICAL TRANSFER FUNCTION; PHOSPHORS; QUANTUM EFFICIENCY; X RAY DIFFRACTION;

EID: 0036816503     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2002.803878     Document Type: Article
Times cited : (13)

References (16)
  • 2
    • 84947829194 scopus 로고
    • High speed photography
    • J. E. Field, "High speed photography," Contemp. Phys., vol. 24, no. 5, pp. 439-459, 1983.
    • (1983) Contemp. Phys. , vol.24 , Issue.5 , pp. 439-459
    • Field, J.E.1
  • 3
    • 4243434581 scopus 로고    scopus 로고
    • High-speed photography
    • [Online]
    • A. Davidhazy. High-Speed Photography. [Online] http://www.rit.edu/~andpph/text-high-speed.html
    • Davidhazy, A.1
  • 4
    • 0025531855 scopus 로고
    • Laser high-speed photography systems used to ammunition measures and tests
    • Bellingham, WA: SPIE
    • W. Yuren, Laser High-Speed Photography Systems Used to Ammunition Measures and Tests. Bellingham, WA: SPIE, 1990, vol. SPIE-1346, Ultrahigh-and High-Speed Photography, Videography, Photonics, and Velocimetry, pp. 331-337.
    • (1990) Ultrahigh-and High-Speed Photography, Videography, Photonics, and Velocimetry , vol.SPIE-1346 , pp. 331-337
    • Yuren, W.1
  • 6
    • 0011943037 scopus 로고    scopus 로고
    • [Online]
    • http://www.hadland1.demon.co.uk/products/framing.html [Online]
  • 10
    • 0035764799 scopus 로고    scopus 로고
    • A comparative study of CsI(Tl) screens for macromolecular crystallography
    • S. V. Tipnis, V. V. Nagarkar, S. R. Miller, and V. Gaysinskiy, "A comparative study of CsI(Tl) screens for macromolecular crystallography," Proc. SPIE, vol. 4508, pp. 15-19, 2001.
    • (2001) Proc. SPIE , vol.4508 , pp. 15-19
    • Tipnis, S.V.1    Nagarkar, V.V.2    Miller, S.R.3    Gaysinskiy, V.4
  • 13
    • 0031252149 scopus 로고    scopus 로고
    • CCD based high resolution nondestructive testing system for industrial applications
    • V. V. Nagarkar, S. Vasile, P. Gothoskar, J. S. Gordon, and T. K. Gupta, "CCD based high resolution nondestructive testing system for industrial applications," Appl. Radiat. Isot., vol. 48, pp. 1459-1465, 1997.
    • (1997) Appl. Radiat. Isot. , vol.48 , pp. 1459-1465
    • Nagarkar, V.V.1    Vasile, S.2    Gothoskar, P.3    Gordon, J.S.4    Gupta, T.K.5
  • 16


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.