CCD based high resolution non-destructive testing system for industrial applications

Applied Radiation and Isotopes

Volumn 48, Issue 10-12, 1997, Pages 1459-1465

  Nagarkar, V V ^a   Vasile, S ^a   Gothoskar, P ^a   Gordon, J S ^a   Gupta, T K ^a  

^a RADIATION MONITORING DEVICES INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COUPLED DEVICES; DATA ACQUISITION; IMAGE QUALITY; INDUSTRIAL APPLICATIONS; NONDESTRUCTIVE EXAMINATION; SUBSTRATES; X RAYS;

HIGH RESOLUTION NONDESTRUCTIVE EVALUATION;

IMAGE SENSORS;

CAMERA; COMPUTER ASSISTED TOMOGRAPHY; CONFERENCE PAPER; IMAGING SYSTEM; PRIORITY JOURNAL; SENSOR; THREE DIMENSIONAL IMAGING; X RAY;

EID: 0031252149     PISSN: 09698043     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0969-8043(97)00141-3     Document Type: Conference Paper

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