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Volumn 195, Issue 3-4, 2002, Pages 408-413
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Analysis of ancient glass using ion beams and related techniques
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Author keywords
[No Author keywords available]
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Indexed keywords
ALGORITHMS;
CORROSION;
FLUORESCENCE;
GLASS;
NONDESTRUCTIVE EXAMINATION;
SEMICONDUCTING SILICON;
X RAY ANALYSIS;
SURFACE CHARACTERIZATION;
ION BEAMS;
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EID: 0036797621
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-583X(02)01139-4 Document Type: Article |
Times cited : (9)
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References (19)
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