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Volumn 195, Issue 3-4, 2002, Pages 408-413

Analysis of ancient glass using ion beams and related techniques

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; CORROSION; FLUORESCENCE; GLASS; NONDESTRUCTIVE EXAMINATION; SEMICONDUCTING SILICON; X RAY ANALYSIS;

EID: 0036797621     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(02)01139-4     Document Type: Article
Times cited : (9)

References (19)
  • 5
    • 0011055753 scopus 로고    scopus 로고
    • J.L. Duggan, I.L. Morgan (Eds.), Proceedings of 14th International Conference on Accelerator Applications in Research and Industry, Denton, Texas, 6-9 November 1996
    • St. Jankuhn et al., in: J.L. Duggan, I.L. Morgan (Eds.), Proceedings of 14th International Conference on Accelerator Applications in Research and Industry, Denton, Texas, 6-9 November 1996, AIP Conf. Proc. 392, 1997, p. 611.
    • (1997) AIP Conf. Proc. , vol.392 , pp. 611
    • Jankuhn, St.1
  • 19
    • 0011051440 scopus 로고    scopus 로고
    • Private communication
    • G. Weber et al., Private communication
    • Weber, G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.