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Volumn 170, Issue 3, 2000, Pages 467-473

Determination of sulphur and copper depth distribution in patina layers using nuclear reaction techniques

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; GAMMA RAYS; GROUND STATE; PROTONS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SULFUR;

EID: 0034299882     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(00)00250-0     Document Type: Article
Times cited : (10)

References (18)
  • 16
    • 85031558415 scopus 로고
    • in: J.R. Tesmer, M. Nastasi (Eds.), Materials Research Society, Pittsburgh
    • W.A. Lanford, in: J.R. Tesmer, M. Nastasi (Eds.), Handbook of modern ion beam Materials analysis, Materials Research Society, Pittsburgh, 1995, pp. 195-204.
    • (1995) Handbook of Modern Ion Beam Materials Analysis , pp. 195-204
    • Lanford, W.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.