Stability of intergranular phases in hot-pressed Si3N4 studied with mechanical spectroscopy and in-situ high-temperature XRD

Journal of the European Ceramic Society

Volumn 22, Issue 11, 2002, Pages 1897-1904

  Duan, R G ^a   Roebben, G ^a   Vleugels, J ^a   Van der Biest, O ^a  

^a UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

Damping; Grain boundaries; Hot pressing; Internal friction; Si3N4; X ray methods

Indexed keywords

CERAMIC MATERIALS; CRYSTALLIZATION; GLASS TRANSITION; HEAT TREATMENT; POSITIVE IONS; X RAY DIFFRACTION;

DAMPING PEAK HEIGHTS;

SILICON COMPOUNDS;

SILICON NITRIDE;

EID: 0036779018     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0955-2219(01)00511-8     Document Type: Article

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