Experimental (XPS/STM) and theoretical (FLAPW) studies of model systems M1/4TiS2 (M = Fe, Co, Ni): Influence of the inserted metal

Journal of Electron Spectroscopy and Related Phenomena

Volumn 125, Issue 3, 2002, Pages 181-196

  Martinez, H ^a   Tison, Y ^a   Baraille, I ^a   Loudet, M ^a   Gonbeau, D ^a  

^a UNIVERSITÉ DE PAU ET DES PAYS DE L'ADOUR   (France)

Author keywords

Calculated densities of states; Core peaks; Insertion; Scanning tunneling microscopy (STM); Valence bands; X ray photoelectron spectroscopy (XPS)

Indexed keywords

BAND STRUCTURE; CRYSTAL LATTICES; CRYSTALLOGRAPHY; ELECTRONIC DENSITY OF STATES; ELECTRONIC STRUCTURE; SCANNING TUNNELING MICROSCOPY; TRANSITION METAL COMPOUNDS;

METAL INSERTION;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0036740960     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0368-2048(02)00136-6     Document Type: Article

References (35)

1. Rouxel J. Lévy F.A. (Ed.), Intercalated Layered Materials, P201 1979 Reidel Dordrecht.
2. Vandenberg-Voorhoeve J.M. Lee P.A., Optical and Electronic Properties 1979 423 Reidel Dordrecht.
3. Subba-Rao G.V., Shafer M.W. Lévy F.A., Intercalated Layered Materials 1976 Reidel, Dordrecht.
4. Whittinghan M.S. Prog. Solid State Chem. 12: 1978 41.
5. Inoue M., Hughes H.P., Yoffe A.D. Adv. Phys. 38: 5 1989 565.
6. Inoue M., Koyano M., Negishi H., Veda Y. J. Phys. Soc. Jpn. 55: 1986 1400.
7. Friend R.H., Yoffe A.D. Adv. Phys. 36: 1987 1.
8. Zunger A., Freeman A.J. Phys. Rev. B 16: 1977 906.
9. Whangbo M.H., Rouxel J., Trichet L. Inorg. Chem. 24: 1985 1824.
10. Weitering H.H., Hibma T. J. Phys. Condens. Matter. 3: 1991 8535.
11. Fujimori A., Suga S., Negishi H., Inoue M. Phys. Rev. B 38: 1988 3676.
12. Yamasaki T., Suzuki N., Motizuki K. J. Phys. C: Solid State Phys. 20: 1987 395.
13. Suzuki N., Yamasaki T., Motizuki K. J. Phys. C: Solid State Phys. 21: 1988 6133.
14. Martinez H., Matar S.F., Auriel C., Loudet M., Pfister-Guillouzo G. J. Alloys Comp. 245: 1996 30-39.
15. Martinez H., Auriel C., Matar S.F., Pfister-Guillouzo G. J. Electron. Spectrosc. Relat. Phenom. 87: 1997 19-30.
16. Motizuki K., Suzuki N. Mater. Sci. Forum 91-93: 1992 381.
17. Dijkstra J., Bruggen C.F., Haas C.J. Phys. Condens. Matter. 1: 1989 4297.
18. Benoist L., Gonbeau D., Pfister-Guillouzo G., Schmidt F., Meunier G., Levasseur A. Solid State Ionics 76: 1995 81.
19. Martin I., Vinatier P., Levasseur A., Dupin J.C., Gonbeau D. J. Power Sources 81: 1999 306.
20. Dupin J.C., Gonbeau D., Martin-Litas I., Vinatier P., Levasseur A. J. Electron Spectrosc. Relat. Phenom. 120: 2001 55.
21. Martinez H., Auriel C., Gonbeau D., Loudet M., Pfister-Guillouzo G. Appl. Surf. Sci. 125: 1998 259.
22. Martinez H., Azavant P., Loudet M. Surf. Sci. 400: 1998 247.
23. Inoue M., Negishi H. J. Phys. Chem. 90: 1986 235.
24. Goodenough J.B. Reiss H., Progress in Solid State Chemistry 1971 Pergamon Oxford. Vol. 5.
25. Subba Rao G.V., Shafer M.W., Tao L. Mater. Res. Bull. 8: 1973 1231.
26. Blaha P., Schwarz K., Luitz J. WIEN97 1997 Vienna University of Technology Vienna. improved and updated Unix version of the original copyrighted Wien-code, which was published by P. Blaha, K. Schwarz, P. Sorantin, S.B. Trickey, Comput. Phys. Commun. 59 (1990) 399.
27. Perdew J.P., Burke S., Erbzerhof M. Phys. Rev. Lett. 77: 1996 3865.
28. Blöchl P., Jempsen O., Anderson O. Phys. Rev. B 49: 1994 16223.
29. Magonov S.N., Whangboo M.H. Adv. Mater. 6: 1994 355.
30. Zimmermann R., Steiner P., Claessen R., Reinert F., Hüfner S., Blaha P., Dufek P. J. Phys. Condens. Matter. 11: 1999 1657.
31. Dartigeas K., Benoist L., Gonbeau D., Pfister-Guillouzo G., Ouvrard G., Levasseur A. J. Electron Spectrosc. Relat. Phenom. 83: 1997 45.
32. Meakin J.I., Klipstein P.C., Friend R.H. J. Phys. C 20: 1987 271.
33. Scofield J.H. J. Electron Spectrosc. Relat. Phenom. 8: 1976 129.
34. Blaha P. J. Phys. Condens. Matter. 3: 1991 9381.
35. Negishi H., Ohara S., Takata Y., Yokoyama T., Tarrigushi M., Inoue M. Mater. Sci. Forum 91-93: 1992 603.