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Volumn 125, Issue 3-4, 1998, Pages 259-272

Surface analysis of two misfit layer compounds - (PbS) 1.18 (TiS 2 ) and (PbS) 1.18 (TiS 2 ) 2 - By scanning probe microscopies (AFM and STM) and X-ray photoelectron spectroscopy (XPS)

(5) Martinez, H a Auriel, C a Gonbeau, D a Loudet, M a Pfister Guillouzo, G a

a UNIVERSITÉ DE PAU ET DES PAYS DE L'ADOUR (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; HYDROLYSIS; OXIDATION; SCANNING TUNNELING MICROSCOPY; SURFACE STRUCTURE; SURFACE TREATMENT; X RAY PHOTOELECTRON SPECTROSCOPY;

MISFIT LAYER COMPOUNDS;

LEAD COMPOUNDS;

EID: 0032024296 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/S0169-4332(97)00503-5 Document Type: Article

Times cited : (8)

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