Giant nonlinear optical properties of bismuth thin films grown by pulsed laser deposition

Optics Letters

Volumn 27, Issue 17, 2002, Pages 1549-1551

  Liu, D R ^a   Wu, K S ^a   Shih, M F ^a   Chern, M Y ^a  

^a NATIONAL TAIWAN UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH; ELECTROMAGNETIC WAVE ABSORPTION; ELLIPSOMETRY; FILM GROWTH; LASER BEAMS; LIGHT REFLECTION; NONLINEAR OPTICS; PULSED LASER DEPOSITION; REFRACTIVE INDEX; SPECTROSCOPIC ANALYSIS; SUBSTRATES; X RAYS;

GAUSSIAN BEAMS;

THIN FILMS;

EID: 0036731199     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.27.001549     Document Type: Article

References (14)