Spectroscopic ellipsometry of composite thin films with embedded Bi nanocrystals

Journal of Applied Physics

Volumn 84, Issue 8, 1998, Pages 4509-4516

  Serna, R ^a   de Sande, J C G ^a   Ballesteros, J M ^a   Afonso, C N ^a  

^a CSIC   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; AMORPHOUS MATERIALS; BISMUTH; DEPOSITION; ELLIPSOMETRY; MATHEMATICAL MODELS; NANOSTRUCTURED MATERIALS; PULSED LASER APPLICATIONS; REFRACTIVE INDEX; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SEMICONDUCTING GERMANIUM; TRANSMISSION ELECTRON MICROSCOPY;

BISMUTH NANOCRYSTALS; COMPOSITE FILM; PULSED LASER DEPOSITION;

THIN FILMS;

EID: 0032531582     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.368676     Document Type: Article

References (26)