|
Volumn 11, Issue 9, 2002, Pages 1653-1659
|
Effects of substrate bias on nanotribologyof a-C:H films deposited by ECR-MPCVD
c
Sinonar Corp
(Taiwan)
|
Author keywords
a C:H films; Electron cyclotron resonance microwave plasma chemical vapor deposition; Nanotribology; Scanning probe microscopy
|
Indexed keywords
CARBON;
CHEMICAL VAPOR DEPOSITION;
SCANNING ELECTRON MICROSCOPY;
SUBSTRATES;
TRIBOLOGY;
CARBON FILMS;
AMORPHOUS FILMS;
CARBON;
COATING;
DIAMOND-LIKE CARBON;
FILM;
HARDNESS;
PLASMA TREATMENT;
TRIBOLOGY;
WEAR RESISTANCE;
|
EID: 0036720574
PISSN: 09259635
EISSN: None
Source Type: Journal
DOI: 10.1016/S0925-9635(02)00136-X Document Type: Article |
Times cited : (16)
|
References (26)
|