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Volumn 49 I, Issue 4, 2002, Pages 1960-1964

Photo-electronic investigation of CdZnTe spectral detectors

Author keywords

Charge collection efficiency; Edge frequency; Electric field; Infrared (IR) microscopy; Pockels effect; Pulsed beam; Subbandgap

Indexed keywords

ELECTRIC DISTORTION; ELECTRIC FIELD EFFECTS; LASER BEAMS; LIGHT SOURCES; SEMICONDUCTING CADMIUM COMPOUNDS; SPECTRUM ANALYZERS;

EID: 0036702984     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2002.801702     Document Type: Article
Times cited : (11)

References (8)
  • 1
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    • Parnham, K.B.1
  • 2
    • 0031289311 scopus 로고    scopus 로고
    • Characterization of bulk CdZnTe by IR transmission imaging
    • F.P. Doty, J.P. Cozzatti, and J.P. Schomer, "Characterization of bulk CdZnTe by IR transmission imaging," Proc. SPIE, vol. 3115, pp. 51-55, 1997.
    • (1997) Proc. SPIE , vol.3115 , pp. 51-55
    • Doty, F.P.1    Cozzatti, J.P.2    Schomer, J.P.3
  • 4
    • 0030165410 scopus 로고    scopus 로고
    • Infra-red microscopy of Cd(Zn)Te radiation detectors revealing their internal electric field structure under bias
    • June
    • P. De Antonis, E.J. Morton, and F.J.W. Podd, "Infra-red microscopy of Cd(Zn)Te radiation detectors revealing their internal electric field structure under bias," IEEE Trans. Nucl. Sci., vol. 43, pp. 1487-1490, June 1996.
    • (1996) IEEE Trans. Nucl. Sci. , vol.43 , pp. 1487-1490
    • De Antonis, P.1    Morton, E.J.2    Podd, F.J.W.3
  • 5
    • 0035250719 scopus 로고    scopus 로고
    • Investigation of Au-CdZnTe contacts using photovoltaic measurement
    • E.J. Morton, M.A. Hossain, P. De Antonis, and A.M.D. Ede, "Investigation of Au-CdZnTe contacts using photovoltaic measurement," Nucl. Instrum. Methods, vol. A 458, pp. 558-562, 2001.
    • (2001) Nucl. Instrum. Methods , vol.A 458 , pp. 558-562
    • Morton, E.J.1    Hossain, M.A.2    De Antonis, P.3    Ede, A.M.D.4
  • 6
    • 0031288887 scopus 로고    scopus 로고
    • Optical characterization of the internal electric field distribution under bias of CdZnTe radiation detectors
    • H.W. Yao, R.J. Anderson, and R.B. James, "Optical characterization of the internal electric field distribution under bias of CdZnTe radiation detectors," Proc. SPIE, vol. 3115, pp. 62-68, 1997.
    • (1997) Proc. SPIE , vol.3115 , pp. 62-68
    • Yao, H.W.1    Anderson, R.J.2    James, R.B.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.