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Volumn 49 I, Issue 4, 2002, Pages 1960-1964
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Photo-electronic investigation of CdZnTe spectral detectors
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Author keywords
Charge collection efficiency; Edge frequency; Electric field; Infrared (IR) microscopy; Pockels effect; Pulsed beam; Subbandgap
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Indexed keywords
ELECTRIC DISTORTION;
ELECTRIC FIELD EFFECTS;
LASER BEAMS;
LIGHT SOURCES;
SEMICONDUCTING CADMIUM COMPOUNDS;
SPECTRUM ANALYZERS;
PULSED RADIATION;
RADIATION DETECTORS;
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EID: 0036702984
PISSN: 00189499
EISSN: None
Source Type: Journal
DOI: 10.1109/TNS.2002.801702 Document Type: Article |
Times cited : (11)
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References (8)
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