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Volumn 22, Issue 8, 2002, Pages 1008-1010
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Sub-wavelength gratings based on a new microfabrication technology
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Author keywords
Electron beam scanning exposure; Fast atom beam etching; Sub wavelength gratings
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
ETCHING;
FABRICATION;
SCANNING ELECTRON MICROSCOPY;
ELECTRON BEAM SCANNING EXPOSURE;
FAST ATOM BEAM ETCHING;
SUBWAVELENGTH GRATING;
OPTICAL DEVICES;
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EID: 0036700788
PISSN: 02532239
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (10)
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References (6)
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