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Volumn 34, Issue 1, 2002, Pages 498-501

XPS study of fresh and oxidized (Pb,Ge)Te surfaces

Author keywords

(Pb,Ge)Te; Oxidation; XPS

Indexed keywords

CRYSTAL LATTICES; ELECTRON ENERGY LEVELS; GERMANIUM; LEAD; MOISTURE DETERMINATION; OXIDATION; PHASE TRANSITIONS; TELLURIUM; THERMAL EFFECTS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0036693084     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.1347     Document Type: Conference Paper
Times cited : (11)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.