XPS study of fresh and oxidized GeTe and (Ge,Sn)Te surface

Solid State Ionics

Volumn 141-142, Issue , 2001, Pages 513-522

  Yashina, L V ^a   Kobeleva, S P ^b   Shatalova, T B ^a   Zlomanov, V P ^a   Shtanov, V I ^a  

^a MOSCOW STATE UNIVERSITY   (Russian Federation)

^b INSTITUTE OF RARE METALS   (Russian Federation)

Author keywords

(Ge,Sn)Te; GeTe; Oxidation; VLS crystal growth; XPS

Indexed keywords

CRYSTAL GROWTH; OXIDATION; VACUUM APPLICATIONS; X RAY PHOTOELECTRON SPECTROSCOPY;

INTERMEDIATE OXIDATION;

SEMICONDUCTING GERMANIUM COMPOUNDS;

EID: 0035329715     PISSN: 01672738     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-2738(01)00785-8     Document Type: Conference Paper

References (19)

1. An X-ray photoelectron spectroscopic study of the oxidation of galena
2. Charge impurity state of In, Ga, Ge in narrow-gap PbTe