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Volumn 38, Issue 16, 2002, Pages 883-884

High-reliability MOCVD-grown quantum dot laser

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC POWER MEASUREMENT; METALLORGANIC CHEMICAL VAPOR DEPOSITION; MIRRORS; RELIABILITY; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING INDIUM GALLIUM ARSENIDE; SEMICONDUCTOR GROWTH; SEMICONDUCTOR LASERS; SEMICONDUCTOR QUANTUM DOTS; TEMPERATURE MEASUREMENT;

EID: 0036685459     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:20020602     Document Type: Article
Times cited : (47)

References (11)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.