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Volumn 38, Issue 16, 2002, Pages 883-884
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High-reliability MOCVD-grown quantum dot laser
a a a b b b b |
Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRIC POWER MEASUREMENT;
METALLORGANIC CHEMICAL VAPOR DEPOSITION;
MIRRORS;
RELIABILITY;
SEMICONDUCTING GALLIUM ARSENIDE;
SEMICONDUCTING INDIUM GALLIUM ARSENIDE;
SEMICONDUCTOR GROWTH;
SEMICONDUCTOR LASERS;
SEMICONDUCTOR QUANTUM DOTS;
TEMPERATURE MEASUREMENT;
QUANTUM DOT LASERS;
CONTINUOUS WAVE LASERS;
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EID: 0036685459
PISSN: 00135194
EISSN: None
Source Type: Journal
DOI: 10.1049/el:20020602 Document Type: Article |
Times cited : (47)
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References (11)
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