Spread of critical currents in thin-film YBa2Cu3O7-x bicrystal junctions and faceting of grain boundary

Physica C: Superconductivity and its Applications

Volumn 372-376, Issue PART 1, 2002, Pages 80-82

  Shadrin, P ^a   Jia, C L ^a   Divin, Y ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

Grain boundary; Josephson junction; Spread of critical current

Indexed keywords

CRITICAL CURRENTS; ELECTRIC POTENTIAL; GRAIN BOUNDARIES; LASER BEAMS; MICROSCOPIC EXAMINATION; SEMICONDUCTOR JUNCTIONS; SUBSTRATES; YTTRIUM BARIUM COPPER OXIDES;

BICRYSTALS; LASER SCANNING MICROSCOPY;

THIN FILMS;

EID: 0036682909     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(02)00786-4     Document Type: Conference Paper

References (5)