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Volumn 38, Issue 25, 1999, Pages 5408-5412

Digital speckle-pattern interferometry: Fringe retrieval for large in-plane deformations with digital speckle photography

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE ANALYSIS; IMAGE PROCESSING; PHOTOGRAPHY; SPECKLE;

EID: 0032620568     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.38.005408     Document Type: Article
Times cited : (34)

References (10)
  • 1
    • 0027789449 scopus 로고
    • Temporal phaseunwrapping algorithm for automated interferogram analysis
    • J. M. Huntley and H. O. Saldner, “Temporal phaseunwrapping algorithm for automated interferogram analysis,” Appl. Opt. 32, 3047-3052 (1993).
    • (1993) Appl. Opt. , vol.32 , pp. 3047-3052
    • Huntley, J.M.1    Saldner, H.O.2
  • 2
    • 18444411982 scopus 로고    scopus 로고
    • Speckle interferometry with temporal phase evaluation for measuring large-object deformation
    • C. Joenathan, B. Franze, P. Haible, and H. J. Tiziani, “Speckle interferometry with temporal phase evaluation for measuring large-object deformation,” Appl. Opt. 37, 2608-2614 (1998).
    • (1998) Appl. Opt. , vol.37 , pp. 2608-2614
    • Joenathan, C.1    Franze, B.2    Haible, P.3    Tiziani, H.J.4
  • 3
    • 0028532084 scopus 로고
    • Electronic speckle photography: Increased accuracy by nonintegral pixel shifting
    • M. Sjodahl, “Electronic speckle photography: increased accuracy by nonintegral pixel shifting,” Appl. Opt. 33, 6667-6673 (1994).
    • (1994) Appl. Opt. , vol.33 , pp. 6667-6673
    • Sjodahl, M.1
  • 4
    • 0000560396 scopus 로고    scopus 로고
    • Three-dimensional deformation field measurements with simultaneous TV holography and electronic speckle photography
    • M. Sjodahl and H. O. Saldner, “Three-dimensional deformation field measurements with simultaneous TV holography and electronic speckle photography,” Appl. Opt. 36, 3645-3648 (1997).
    • (1997) Appl. Opt. , vol.36 , pp. 3645-3648
    • Sjodahl, M.1    Saldner, H.O.2
  • 5
    • 0028538210 scopus 로고
    • Systematic and random errors in electronic speckle photography
    • M. Sjodahl and L. R. Benckert, “Systematic and random errors in electronic speckle photography,” Appl. Opt. 33, 7461-7471 (1994).
    • (1994) Appl. Opt. , vol.33 , pp. 7461-7471
    • Sjodahl, M.1    Benckert, L.R.2
  • 6
    • 84970903939 scopus 로고
    • Marcel Dekker, New York
    • R. S. Sirohi, Speckle Metrology (Marcel Dekker, New York, 1993), pp. 69-71.
    • (1993) Speckle Metrology , pp. 69-71
    • Sirohi, R.S.1
  • 8
    • 0037581605 scopus 로고
    • Theory and applications of electronic holography
    • K. A. Stetson and R. J. Pryputniewicz, eds. (Society for Experimental Mechanics, Bethel, Conn
    • K. A. Stetson, “Theory and applications of electronic holography,” in Proceedings of the International Conference on Hologram Interferometry and Speckle Metrology, K. A. Stetson and R. J. Pryputniewicz, eds. (Society for Experimental Mechanics, Bethel, Conn., 1990), pp. 294-300.
    • (1990) Proceedings of the International Conference on Hologram Interferometry and Speckle Metrology , pp. 294-300
    • Stetson, K.A.1
  • 9
    • 0038464645 scopus 로고    scopus 로고
    • Complex division as a common basis for calculating phase differences in electronic speckle pattern interferometry in one step
    • J. Burka and H. Helmers, “Complex division as a common basis for calculating phase differences in electronic speckle pattern interferometry in one step,” Appl. Opt. 37, 2589-2590 (1998).
    • (1998) Appl. Opt. , vol.37 , pp. 2589-2590
    • Burka, J.1    Helmers, H.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.