Extension of the displacement measurement range for electronic speckle-shearing pattern interferometry using carrier fringes and a temporal-phase-unwrapping method

Optical Engineering

Volumn 39, Issue 3, 2000, Pages 751-757

  Martinez Celorio R A ^a,c,d   Davila A ^a   Kaufmann, G H ^b   Mendiola, G ^a,e  

^a CENTRO DE INVESTIGACIONES EN ÓPTICA   (Mexico)

^b INSTITUTO DE FÍSICA ROSARIO   (Argentina)

^c Polytechnic Institute   (Cuba)

^d Telecommunication Laboratory   (Cuba)

^e UNIVERSITY OF GUANAJUATO   (Mexico)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; IMAGE PROCESSING; MOIRE FRINGES; NUMERICAL METHODS; OPTICAL SYSTEMS; SPECKLE;

CARRIER FRINGES; DISPLACEMENT MEASUREMENT RANGE; ELECTRONIC SPECKLE SHEARING PATTERN INTERFEROMETRY; OUT OF PLANE DISPLACEMENTS; SPATIAL SYNCHRONOUS DETECTION; TEMPORAL PHASE UNWRAPPING METHOD;

INTERFEROMETRY;

EID: 0343390489     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.602423     Document Type: Article

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