Evaluation of the rejection ratio of an MMI-based higher order mode falter using optical low-coherence reflectometry

IEEE Photonics Technology Letters

Volumn 14, Issue 7, 2002, Pages 968-970

  Kohtoku, Masaki ^b   Shibata, Yasuo ^b   Yoshikuni, Yuzo ^a,b  

^a IEEE

^b NTT CORPORATION   (Japan)

Author keywords

Mode filter; Multimode interference (MMI) coupler; OLCR; Optical reflection; Semiconductor waveguide

Indexed keywords

OPTICAL FILTERS; OPTICAL WAVEGUIDES; REFRACTIVE INDEX; SIGNAL INTERFERENCE;

MULTIMODE INTERFERENCE (MMI) COUPLERS; OPTICAL LOW-COHERENCE REFLECTOMETRY;

REFLECTOMETERS;

EID: 0036649699     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: 10.1109/LPT.2002.1012401     Document Type: Article

References (8)

1. Optical multi-mode interference devices based on self-imaging principles and applications
2. Multimode interference filter to solve degradation on coupler common-mode rejection
3. Optical low coherence reflectometry for characterization of optical devices
4. Measurements of a semiconductor waveguide using a low-coherence interferometric reflectometer
5. Optical low-coherence reflectometer for measuring WDM components
6. A novel design proposal to minimize reflections in deep-ridge multimode interference couplers
7. Analysis of distributed feedback lasers using optical low-coherence reflectometry
8. Evaluation of the performance of dual-order mode couplers using optical low-coherence reflectometry