Measurements of a semiconductor waveguide using a low-coherence interferometric reflectometer

IEEE Photonics Technology Letters

Volumn 8, Issue 2, 1996, Pages 251-256

  Kasaya, Kazuo ^a   Yoshikuni, Yuzo ^a   Ishii, Hiroyuki ^a  

^a NTT CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; ESTIMATION; FABRY-PEROT INTERFEROMETERS; INTEGRAL EQUATIONS; LIGHT SOURCES; MIRRORS; OPTICAL VARIABLES MEASUREMENT; OPTICAL WAVEGUIDES; SEMICONDUCTOR MATERIALS;

LOW COHERENCE INTERFEROMETRIC REFLECTOMETER; MICHELSON INTERFEROMETERS; OPTICAL COUPLING FACTOR; PHOTONIC INTEGRATED CIRCUITS; REFLECTOMETER SYSTEM; SEMICONDUCTOR WAVEGUIDES;

REFLECTOMETERS;

EID: 0030080792     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: 10.1109/68.484257     Document Type: Article

References (11)

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