Optical low-coherence reflectometer for measuring WDM components

IEEE Photonics Technology Letters

Volumn 11, Issue 7, 1999, Pages 857-859

  Mechels, S ^a,b   Takada, K ^a   Okamoto, K ^a  

^a NTT CORPORATION   (Japan)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FOURIER TRANSFORM INFRARED SPECTROSCOPY; INTEGRATED OPTICS; INTERFEROMETRY; LIGHT REFLECTION; MOIRE FRINGES; OPTICAL BEAM SPLITTERS; OPTICAL WAVEGUIDES; WAVELENGTH DIVISION MULTIPLEXING;

OPTICAL LOW COHERENCE REFLECTOMETER; OPTICAL PLANAR WAVEGUIDE COMPONENTS; WAVELENGTH DIVISION MULTIPLEXED COMPONENTS;

REFLECTOMETERS;

EID: 0032685271     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: 10.1109/68.769731     Document Type: Article

References (5)

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