Soft X-ray characterization of perpendicular recording media

IEEE Transactions on Magnetics

Volumn 38, Issue 4 I, 2002, Pages 1693-1697

  Fullerton, Eric E ^a   Hellwig, Olav ^a   Ikeda, Yoshihiro ^a   Lengsfield, Byron ^a   Takano, Kentaro ^a   Kortright, Jeffery B ^b  

^a IBM ALMADEN RESEARCH CENTER   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

Cobalt alloys; Electromagnetic scattering by magnetic media; Perpendicular magnetic recording; Small angle scattering; X ray scattering

Indexed keywords

COBALT ALLOYS; GRAIN SIZE AND SHAPE; MAGNETIC RESONANCE; MAGNETIC THIN FILMS; MULTILAYERS; X RAY SCATTERING;

SMALL-ANGLE SCATTERING (SAS);

MAGNETIC RECORDING;

EID: 0036646576     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2002.1017758     Document Type: Article

References (12)

1. Thermal effect limits in ultrahigh-density magnetic recording
2. Medium noise and grain size analysis of CoCrPt/Ti perpendicular media with NiAl seed layers
3. 1-x/Pt multilayers as perpendicular recording media
4. Advanced magnetic recording media for high-density data storage
5. Superlattice magnetic recording media: Experiment and simulation
6. Research frontiers in magnetic materials at soft X-ray synchrotron radiation facilities
7. 20 exchange-spring magnets studied by resonant soft X-ray magneto-optical Kerr effect
8. Soft X-ray small-angle scattering as a sensitive probe of magnetic and charge heterogeneity
9. Sigmalike phase and nanoscale segregation in polycrystalline FexCr1-x films: An element-resolved magnetic and structural study
10. Resolving magnetic and chemical correlations in CoPtCr films using soft X-ray resonant scattering
11. Role of B on grain sizes and magnetic correlation lengths in recording media as determined by soft X-ray scattering
12. Small-angle neutron scattering study of magnetic microstructures in Co-Cr films