Medium noise and grain size analysis of CoCrPt/Ti perpendicular media with NiAl seed layer

IEEE Transactions on Magnetics

Volumn 37, Issue 4 I, 2001, Pages 1583-1585

  Ikeda, Y ^a   Sonobe, Y ^a   Zeltzer, G ^b   Yen, B K ^a   Takano, K ^a   Do, H ^a   Fullerton, E E ^a   Rice, P ^a  

^a IBM ALMADEN RESEARCH CENTER   (United States)

^b STANFORD UNIVERSITY   (United States)

Author keywords

CoCrPt; Grain size; NiAl; Perpendicular recording media

Indexed keywords

COBALT ALLOYS; DEPOSITION; GRAIN SIZE AND SHAPE; LOW TEMPERATURE EFFECTS; MULTILAYERS; NICKEL ALLOYS; SIGNAL TO NOISE RATIO;

PERPENDICULAR MAGNETIC RECORDING;

MAGNETIC RECORDING;

EID: 0035386840     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.950907     Document Type: Article

References (7)

1. Perpendicular magnetic recording
2. The feasibility of magnetic recording at 1 Terabit per square inch
3. NiAl under layer for CoCrTa magnetic thin films
4. Effect of Cr intermediate layers on CoCrPt thin film media on NiAl underlayers
5. 2 longitudinal media on a glass substrate (invited)
6. The role of NiAl under layer in longitudinal thin-film recording media
7. A synthetic compositional-phase diagram for sputtered Co-Cr thin films