SCOPUS 정보 검색 플랫폼

Microelectronics Reliability

Volumn 42, Issue 7, 2002, Pages 1021-1028

Multiple quantum well PIN optoelectronic devices and a method of restoring failed device characteristics

(6) Ikossi, K a Rabinovich, W S a Katzer, D S a Binari, S C a Mittereder, J a Goetz, P G a

a NAVAL RESEARCH LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; CRYSTALLINE MATERIALS; FAILURE ANALYSIS; FIBER OPTIC SENSORS; LIGHT MODULATORS; MOLECULAR BEAM EPITAXY; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR QUANTUM WELLS;

REMOTE COMMUNICATION SYSTEMS;

OPTOELECTRONIC DEVICES;

EID: 0036642358 PISSN: 00262714 EISSN: None Source Type: Journal
DOI: 10.1016/S0026-2714(02)00066-5 Document Type: Conference Paper

Times cited : (5)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.