Relationships between interfacial interaction, electrode formulation and cofiring mismatch of relaxor-based multilayer ceramic devices

Journal of Materials Science: Materials in Electronics

Volumn 12, Issue 2, 2001, Pages 117-121

  Zuo, R ^a   Li, L ^a   Gui, Z ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION; FERROELECTRIC MATERIALS; INTERDIFFUSION (SOLIDS); INTERFACES (MATERIALS); MIXTURES; MULTILAYERS; RELIABILITY; STRESS CONCENTRATION;

COFIRING MISMATCH; INTERFACIAL INTERACTION; MULTILAYER CERAMIC DEVICES;

ELECTRODES;

EID: 0035244812     PISSN: 09574522     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1011258321843     Document Type: Article

References (12)