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Volumn 27, Issue 8, 2001, Pages 889-893

Interfacial development and microstructural imperfection of multilayer ceramic chips with Ag/Pd electrodes

Author keywords

A. Tape casting; Advanced ceramics; B. Defects; B. Interfaces

Indexed keywords

DEFECTS; DELAMINATION; DENSIFICATION; ELECTRODES; GRAIN GROWTH; INTERFACES (MATERIALS); MICROSTRUCTURE; MULTILAYERS; SCANNING ELECTRON MICROSCOPY; SINTERING; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0035172983     PISSN: 02728842     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0272-8842(01)00047-5     Document Type: Article
Times cited : (24)

References (18)
  • 2
    • 0002578896 scopus 로고    scopus 로고
    • Capacitor manufacturers face challenges in the next century
    • (1997) Ceram. Ind. , vol.9 , pp. 28-29
    • Robert, B.1
  • 4
  • 14
    • 84944648082 scopus 로고
    • Revised effective ionic radii and systematic studies of interatomic distances in halides and chalcogenides
    • (1976) Acta Crystallogr. A , vol.32 , pp. 751-767
    • Shannon, R.D.1
  • 17
    • 0031161860 scopus 로고    scopus 로고
    • Ceramic-electrode interaction in PZT and PNN-PZT multilayer piezoelectric ceramics with Ag/Pd/70/30 inner electrode
    • (1997) J. Mater. Sci. , vol.32 , pp. 3257-3262
    • Caballero, A.C.1    Nieto, E.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.