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Volumn 49 II, Issue 3, 2002, Pages 1164-1169
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Development of a new TDC LSI and a VME module
c
AMSC Co Ltd
(Japan)
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Author keywords
Gate arrays; Large scale integration; Measurement; Time to digital converter
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Indexed keywords
GATE ARRAYS;
PRECISION MUON TRACKING DETECTOR;
TIME TO DIGITAL CONVERTER;
CMOS INTEGRATED CIRCUITS;
DATA ACQUISITION;
DIGITAL SIGNAL PROCESSING;
GATES (TRANSISTOR);
LSI CIRCUITS;
RADIATION DETECTORS;
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EID: 0036624387
PISSN: 00189499
EISSN: None
Source Type: Journal
DOI: 10.1109/TNS.2002.1039631 Document Type: Article |
Times cited : (21)
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References (5)
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