Development of front-end electronics and TDC LSI for the ATLAS MDT

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 453, Issue 1-2, 2000, Pages 365-371

  Arai, Yasuo ^a  

^a INSTITUTE OF PARTICLE AND NUCLEAR STUDIES   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; GAMMA RAYS; MICROPROCESSOR CHIPS; NEUTRON IRRADIATION; PRECISION ENGINEERING; RADIATION DAMAGE;

FRONT-END ELECTRONICS; MUON PRECISION CHAMBERS;

PARTICLE DETECTORS;

EID: 0034291597     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(00)00658-6     Document Type: Article

References (10)

1. M. Virchaux, J.F. Laporte, Reconstruction efficiency and dead time, Unpublished internal muon document.
2. J. Huth, J. Oliver, W. Riegler, E. Hazen, C. Posch, J. Shank, Development of an Octal CMOS ASD for the ATLAS muon detector, Proceedings of the Fifth Workshop on Electronics for LHC Experiments, Snowmass, 1999, CERN/LHCC/99-33, pp. 436-442.
3. J. Chapman, R. Ball, J. Kuah, J. Mann, M. Schneider, J. Uzelac, L. Hu, Data Flow Simulations through the ATLAS Muon Front-End Electronics, Proceedings of the Fifth Workshop on Electronics for LHC Experiments, Snowmass, 1999, CERN/LHCC/99-33, pp. 448-451.
4. IEEE Standard Test Access Port and Boundary-Scan Architecture, IEEE Std 1149.1-1990.
5. Y. Arai, J. Christiansen, TDC architecture study for the ATLAS muon tracker, Proceedings of the Third Workshop on Electronics for LHC Experiments, London, September 1997, CERN/LHC/97-60, pp. 315-319.
6. J. Christiansen, AMT-0 user manual, http: // atlas.kek.jp /~ araiy/amt0/.
7. Y. Arai, Performance and irradiation tests of the 0.3 mm CMOS TDC for the ATLAS MDT, Proceedings of the Fifth Workshop on Electronics for LHC Experiments, Snowmass, 1999, CERN/LHCC/99-33, pp. 462-466.
8. Arai Y., Ikeno M. A time digitizer CMOS gate-array with a 250 ps time resolution. IEEE J. Solid-State Circuits. 31(2):1996;212.
9. Test Method and Procedures for Microelectronics, MIL-STD-883, Method 1019.4.
10. Atlas policy on radiation tolerant electronics (Draft 2). http: // www.cern.ch/Atlas/GROUPS/FRONTEND/radhard.htm.