On the coexistence of different polymorphs in organic epitaxy: α and β phase of PTCDA on Ag(1 1 1)

Applied Surface Science

Volumn 175-176, Issue , 2001, Pages 332-336

  Krause, B ^a   Durr A C ^a   Ritley, K A ^a   Schreiber, F ^a,b   Dosch, H ^a,b   Smilgies, D ^c  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^b UNIVERSITY OF STUTTGART   (Germany)

^c EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

Epitaxy; Organic thin films; Surface crystallography; Surface X ray diffraction

Indexed keywords

BRAGG CELLS; CRYSTALLOGRAPHY; EPITAXIAL GROWTH; LIGHT REFLECTION; PHASE TRANSITIONS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

BRAGG REFLECTIONS; GRAZING-INCIDENCE X-RAY DIFFRACTION; POLYMORPHS;

SEMICONDUCTING FILMS;

EID: 0041866769     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(01)00082-4     Document Type: Article

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