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Volumn 507-510, Issue , 2002, Pages 170-174

Ellipsometric, photoluminescence and Auger electron spectroscopy studies of Zn1-xBexSe and Zn1-x-yBexMnySe crystals

Author keywords

Auger electron spectroscopy; Ellipsometry; Photoluminescence; Semiconducting surfaces

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; CRYSTAL GROWTH FROM MELT; CRYSTALS; DIELECTRIC PROPERTIES; ELLIPSOMETRY; ENERGY GAP; HIGH PRESSURE EFFECTS; PHOTOLUMINESCENCE; SPUTTERING; ZINC ALLOYS;

EID: 0036608945     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(02)01397-3     Document Type: Conference Paper
Times cited : (12)

References (18)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.