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Volumn 507-510, Issue , 2002, Pages 170-174
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Ellipsometric, photoluminescence and Auger electron spectroscopy studies of Zn1-xBexSe and Zn1-x-yBexMnySe crystals
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Author keywords
Auger electron spectroscopy; Ellipsometry; Photoluminescence; Semiconducting surfaces
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Indexed keywords
AUGER ELECTRON SPECTROSCOPY;
CRYSTAL GROWTH FROM MELT;
CRYSTALS;
DIELECTRIC PROPERTIES;
ELLIPSOMETRY;
ENERGY GAP;
HIGH PRESSURE EFFECTS;
PHOTOLUMINESCENCE;
SPUTTERING;
ZINC ALLOYS;
BRIDGMAN METHOD;
SEMICONDUCTING SURFACES;
SURFACE STRUCTURE;
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EID: 0036608945
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(02)01397-3 Document Type: Conference Paper |
Times cited : (12)
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References (18)
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