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Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 192, Issue 4, 2002, Pages 381-392

A new analytical approach for the transport and the emission yield of secondary electrons from insulators

(1) Cazaux, Jacques a

a UNIVERSITÉ DE REIMS CHAMPAGNE ARDENNE (France)

Author keywords

Charging; Electron scattering; Insulators; Secondary electron emission yield

Indexed keywords

COMPUTER SIMULATION; ELECTRIC INSULATING MATERIALS; ELECTRON SCATTERING; INERT GASES; ION BOMBARDMENT; MONTE CARLO METHODS; PHOTONS; SURFACES; X RAYS;

LOW ENERGY ELECTRONS;

SECONDARY EMISSION;

EID: 0036608897 PISSN: 0168583X EISSN: None Source Type: Journal
DOI: 10.1016/S0168-583X(02)00488-3 Document Type: Article

Times cited : (11)

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