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Volumn 91, Issue 11, 2002, Pages 9408-9413

Formation of porous grain boundaries in polycrystalline silicon thin films

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON FILM; FIELD EMISSION SECONDARY ELECTRON MICROSCOPE; FORMATION MECHANISM; PHOSPHORUS DIFFUSION; PHOSPHORUS DOPING; POLY-SI THIN FILM; POLYCRYSTALLINE SILICON (POLY-SI); POLYCRYSTALLINE SILICON THIN FILM; POROUS MICROSTRUCTURE; POST ANNEALING; PRE-DEPOSITION; SILICON ATOMS; TRANSMISSION ELECTRON MICROSCOPE;

EID: 0036607492     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1476088     Document Type: Article
Times cited : (6)

References (21)
  • 20
    • 84861453437 scopus 로고
    • Ph.D. thesis, TR No. G502-10, Stanford University, California
    • E. K. Demirlioglu, Ph.D. thesis, TR No. G502-10, Stanford University, California, 1988.
    • (1988)
    • Demirlioglu, E.K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.