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Journal of Applied Physics

Volumn 91, Issue 11, 2002, Pages 9204-9213

Generation of positive and negative charges under Fowler-Nordheim injection and breakdown

(1) Ushizaka, Hironori a

a NTT CORPORATION (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANODE ELECTRODES; FOWLER-NORDHEIM; FOWLER-NORDHEIM INJECTION; GATE OXIDE; METAL OXIDE SEMICONDUCTOR; NEGATIVE CHARGE; TUNNELING DISTANCE;

ELECTRIC FIELDS; GATES (TRANSISTOR); IMPACT IONIZATION;

MOS DEVICES;

EID: 0036607389 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.1473212 Document Type: Article

Times cited : (3)

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