High-accuracy standard specimens for the line-focus-beam ultrasonic material characterization system

IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control

Volumn 49, Issue 6, 2002, Pages 827-835

  Kushibiki, Jun Ichi ^a,b   Arakawa, Mototaka ^a,b   Okabe, Ryoichi ^b  

^a IEEE   (Japan)

^b TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ULTRASONIC MATERIALS;

ACOUSTIC BULK WAVE DEVICES; ACOUSTIC SURFACE WAVE DEVICES; DIFFRACTION; ELASTIC MODULI; SILICA; SINGLE CRYSTALS; SUBSTRATES; ULTRASONIC PROPAGATION;

ULTRASONICS;

ARTICLE;

EID: 0036591398     PISSN: 08853010     EISSN: None     Source Type: Journal    
DOI: 10.1109/TUFFC.2002.1009343     Document Type: Article

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