Ultrasonic microspectroscopy characterization of silica glass

Journal of Applied Physics

Volumn 87, Issue 6, 2000, Pages 3113-3121

  Kushibiki, Jun Ichi ^a   Wei, Ting Cun ^a   Ohashi, Yuji ^a   Tada, Akira ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001193652     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.372307     Document Type: Article

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