Accurate closed-form expressions for the frequency-dependent line parameters of on-chip interconnects on lossy silicon substrate

IEEE Transactions on Advanced Packaging

Volumn 25, Issue 2, 2002, Pages 288-296

  Weisshaar, Andreas ^a   Lan, Hai ^b,c   Luoh, Amy ^a  

^a Oregon State University   (United States)

^b OREGON STATE UNIVERSITY   (United States)

^c STANFORD UNIVERSITY   (United States)

Author keywords

Closed form expressions; Complex image method; Eddy currents; Line parameters; On chip interconnects; Silicon substrate

Indexed keywords

EDDY CURRENTS; ELECTRIC IMPEDANCE; ELECTROMAGNETIC FIELDS; MICROPROCESSOR CHIPS; SEMICONDUCTING SILICON; SUBSTRATES;

CLOSED-FORM EXPRESSIONS;

MICROSTRIP LINES;

EID: 0036589345     PISSN: 15213323     EISSN: None     Source Type: Journal    
DOI: 10.1109/TADVP.2002.803267     Document Type: Conference Paper

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