Quasi-TEM spectral domain approach for calculating distributed inductance and resistance of microstrip on Si-SiO2 substrate

Electronics Letters

Volumn 34, Issue 13, 1998, Pages 1330-1331

  Tripathi, A ^a   Hahm, Yeon Chang ^a   Weisshaar, A ^a   Tripathi, V K ^a  

^a Oregon State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC RESISTANCE; FREQUENCY DOMAIN ANALYSIS; SEMICONDUCTING SILICON; SILICA; SPECTRUM ANALYSIS; SUBSTRATES;

VECTOR MAGNETIC POTENTIALS;

MICROSTRIP LINES;

EID: 0032093641     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:19980837     Document Type: Article

References (5)

1. 2 system', IEEE Trans. Microw. Theory Tech., 1971, MTT-19, pp. 869-881
2. GILB, J.P.K., and BALANIS, C.A.: 'MIS slow-wave structures over a wide range of parameters', IEEE Trans. Microw. Theory Tech., 1992, MTT-40, pp. 2148-2154
3. CAO WEI , HARRINGTON, R.F., MAUTZ, J.R., and SARKAR, T.K.: 'Multiconductor transmission lines in multilayered dielectric media', IEEE Trans. Microw. Theory Tech., 1984, MTT-4, pp. 439-450
4. TRIPATHI, V.K., KOLLIPARA, R.T., and HAYDEN, L.A.: 'Quasi-TEM spectral domain analysis of thick microstrip for microwave and digital integrated circuits', Electron. Lett., 1989, 25, pp. 1253-1254
5. TRIPATHI, V.K., and BUCOLO, R.: 'A simple network analog approach for the quasi-static characteristics of general lossy, anisotropic, layered structures', IEEE Trans. Microw. Theory Tech., 1985, MTT-33, pp. 1458-1464