New formula for effective dielectric constant in multi-dielectric layer microstrip structure

IEEE Topical Meeting on Electrical Performance of Electronic Packaging

Volumn , Issue , 2000, Pages 163-167

  Yoon, Yeong J ^a   Kim, Bruce ^a  

^a SyChip   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DIELECTRIC MATERIALS; MULTILAYERS; PERMITTIVITY;

MULTIDIELECTRIC LAYER MICROSTRIP LINES;

MICROSTRIP LINES;

EID: 0034497206     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (15)