Characterization of a Fresnel zone plate using higher-order diffraction

Journal of Synchrotron Radiation

Volumn 9, Issue 3, 2002, Pages 115-118

  Takeuchi, Akihisa ^a   Suzuki, Yoshio ^a   Takano, Hidekazu ^a  

^a Institute of Physical and Chemical Research   (Japan)

Author keywords

Fresnel zone plates; Higher order diffraction; X ray microbeams

Indexed keywords

EID: 0036587425     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049502004740     Document Type: Conference Paper

References (7)

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