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Volumn 20, Issue 5, 2002, Pages 854-861

The effect of fabrication parameters on a ridge Mach-Zehnder interferometric (MZI) modulator

(6) Anwar, N b Obayya, S S A b Haxha, S a,b Themistos, C b Rahman, B M A a,b Grattan, K T V b

a IEEE

Author keywords

Bending loss; Electrooptic modulation; Finite element method (FEM); Lithium niobate (LN) (LiNbO3); Mach Zehnder interferometer (MZI); Ridge waveguides

Indexed keywords

ELECTRIC POTENTIAL; ELECTROOPTICAL EFFECTS; ETCHING; FINITE ELEMENT METHOD; INTERFEROMETERS; LITHIUM NIOBATE;

ELECTROOPTIC MODULATION;

LIGHT MODULATORS;

EID: 0036578083 PISSN: 07338724 EISSN: None Source Type: Journal
DOI: 10.1109/JLT.2002.1007940 Document Type: Article

Times cited : (31)

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