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Volumn 21, Issue 9, 2002, Pages 715-717
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Effects of thickness on mechanical properties of conducting polythiophene films
a
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Author keywords
[No Author keywords available]
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Indexed keywords
CONDUCTIVE FILMS;
ELASTIC MODULI;
FRACTURE TESTING;
INTERFEROMETRY;
MICROSTRUCTURE;
PLASTIC DEFORMATION;
SCANNING ELECTRON MICROSCOPY;
STIFFNESS;
STRAIN;
TENSILE STRENGTH;
TENSILE TESTING;
YIELD STRESS;
CONDUCTING POLYTHIOPHENE FILMS;
ELECTRONIC SPECKLE PATTERN INTERFEROMETRY;
TENSILE FRACTURE TEST;
CONDUCTIVE PLASTICS;
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EID: 0036578046
PISSN: 02618028
EISSN: None
Source Type: Journal
DOI: 10.1023/A:1015737106002 Document Type: Article |
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Times cited : (43)
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References (9)
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