Evaluation of impact-induced transient deformations using double-pulsed electronic speckle pattern interferometry and finite elements

Optics and Lasers in Engineering

Volumn 32, Issue 5, 1999, Pages 473-484

  Ruiz, P D ^a   Kaufmann, G H ^a,b   Moller O ^b   Galizzi, G E ^a  

^a Facultad de Ciencias Naturales e Instituto M Lillo   (Argentina)

^b UNIVERSIDAD NACIONAL DE ROSARIO   (Argentina)

Author keywords

[No Author keywords available]

Indexed keywords

CANTILEVER BEAMS; DEFORMATION; FINITE ELEMENT METHOD; IMAGE ANALYSIS; IMPACT TESTING; LIGHT EMISSION; NUMERICAL METHODS; PULSED LASER APPLICATIONS; SPECKLE; THREE DIMENSIONAL;

CORRELATION FRINGES; DIGITAL IMAGE SYSTEM; ELECTRONIC SPECKLE PATTERN INTERFEROMETRY; TRANSIENT DEFORMATIONS;

INTERFEROMETRY;

EID: 0033299434     PISSN: 01438166     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0143-8166(00)00017-8     Document Type: Article

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