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Volumn 91, Issue 9, 2002, Pages 5564-5570

Nonresonant Kerr effect in microporous silicon: Nonbulk dispersive behavior of below band gap χ (3)(ω)

Author keywords

[No Author keywords available]

Indexed keywords

DENSITY OF STATE; DISPERSIVE BEHAVIORS; FREQUENCY DISPERSION; MICROPOROUS SILICON; NON-LINEAR REFRACTION; NONLINEAR REFRACTIVE INDEX; NONRESONANT; OPTICAL NONLINEARITY; OPTICAL SWITCHING APPLICATIONS; QUANTUM SIZE EFFECTS; SCALING RULES; SYSTEMATIC INVESTIGATIONS; THIRD-ORDER;

EID: 0036572601     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1467606     Document Type: Article
Times cited : (37)

References (26)
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    • R. Tomasunias et al., Thin Solid Films 276, 55 (1995). tsf THSFAP 0040-6090
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    • Tomasunias, R.1
  • 13
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    • J. Wang et al., Phys. Rev. Lett. 69, 3252 (1992). prl PRLTAO 0031-9007
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    • Wang, J.1
  • 15
    • 0029391971 scopus 로고
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    • T. Matsumoto et al., J. Electrochem. Soc. 142, 3528 (1995). jes JESOAN 0013-4651
    • (1995) J. Electrochem. Soc. , vol.142 , pp. 3528
    • Matsumoto, T.1
  • 19
    • 84861430173 scopus 로고    scopus 로고
    • edited by L. T. Canham, EMIS Datareview Series No. 18 (INSPEC, London, 1997)
    • P. D. J. Calcott, in Properties of Porous Silicon, edited by L. T. Canham, EMIS Datareview Series No. 18 (INSPEC, London, 1997).
    • Properties of Porous Silicon
    • Calcott, P.D.J.1
  • 21
    • 84861439852 scopus 로고    scopus 로고
    • edited by L. T. Canham, EMIS Datareview Series No. 18 (INSPEC, London, 1997)
    • W. Lang, in Properties of Porous Silicon, edited by L. T. Canham, EMIS Datareview Series No. 18 (INSPEC, London, 1997).
    • Properties of Porous Silicon
    • Lang, W.1
  • 26
    • 84861430526 scopus 로고    scopus 로고
    • S. Lettieri, P. Maddalena, and D. Ninno (unpublished)
    • S. Lettieri, P. Maddalena, and D. Ninno (unpublished).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.