Nonlinear optical refraction of free-standing porous silicon layers

Optics Communications

Volumn 168, Issue 5, 1999, Pages 383-391

  Lettieri, S ^a   Fiore, O ^a   Maddalena, P ^a   Ninno, D ^a   Di Francia, G ^b   La Ferrara, V ^b  

^a UNIVERSITY OF NAPLES FEDERICO II   (Italy)

^b ENEA CR Portici   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; MATHEMATICAL MODELS; POROUS SILICON; QUANTUM THEORY; REFRACTIVE INDEX; THERMAL EFFECTS;

NONLINEAR REFRACTIVE INDEX; OPTICAL STARK EFFECT; Z-SCAN TECHNIQUE;

NONLINEAR OPTICS;

EID: 0033322355     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0030-4018(99)00362-4     Document Type: Article

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